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摘要
利用原子层沉积(ALD)技术选择性沉积SiO2于Mo/HZSM-5催化剂外表面,制备一系列硅修饰的Mo/HZSM-5催化剂,并考察其催化甲烷无氧芳构化反应的性能。通过XRD、NH3-TPD、BET、XPS、TEM等表征手段对其进行表征,结果发现,ALD沉积二氧化硅于Mo/HZSM-5后,SiO2主要沉积于催化剂外表面,催化剂中强酸含量下降,提高了催化剂催化甲烷无氧芳构化性能。
Abstract
Atomic layer deposition (ALD) technique is used to deposit SiO2 selectively onto the external surface of Mo/HZSM-5 to prepare a series of SiO2-modified Mo/HZSM-5 catalysts.The performances of prepared Mo/HZSM-5 catalysts are evaluated through methane dehydroaromatizatioin.By means of XRD,NH3-TPD,BET,XPS,TEM and other characterization measures,it is found that SiO2 is mainly deposited on the external surface of the catalyst,and the content of strong acid in the catalyst decreases,thus improving the catalyst's performance in methane dehydroaromatizatioin.
关键词
原子层沉积
/
烷无氧芳构化
/
氧化硅
Key words
atomic layer deposition
/
methane dehydroaromatization
/
SiO2
Author summay
陈长胜(1993-),男,硕士研究生,研究方向为多相催化,chenc@sxicc.ac.cn
原子层沉积技术选择性修饰Mo/HZSM-5对甲烷无氧芳构化反应的影响[J].
现代化工, 2019, 39(12): 191-195 DOI:10.16606/j.cnki.issn0253-4320.2019.12.040