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摘要
通过微波溶剂热法合成宽禁带ZnGa2O4纳米光催化剂,并利用X射线衍射仪(XRD)、氮气吸脱附仪、紫外-可见漫反射仪(UV-Vis DRS)、透射电镜(TEM)、X射线光电子能谱(XPS)、电子顺磁共振谱仪(ESR)等技术系统表征了不同制备条件对样品物相和微观形貌、比表面积和孔结构、光吸收性能和光催化活性物种等结构和性质的影响。同时,比较了TiO2和ZnGa2O4纳米颗粒在光催化氧化As(Ⅲ)中的性能差异。结果表明,在紫外光照射下,微波溶剂热法制备的ZnGa2O4纳米颗粒具有良好的As(Ⅲ)的光催化氧化能力(40 min可达99.1%),相比于TiO2光催化剂(84.5%)有很大提高。此外,通过对ZnGa2O4纳米光催化剂氧化去除As(Ⅲ)光催化机理的初步探索发现,超氧自由基(O2-·)和空穴(hvb+)是此过程中起主要作用的中间反应活性物种。
Abstract
ZnGa2O4 nanocrystallines are synthesized via a microwave solvothermal method.The as-synthesized ZnGa2O4 samples are characterized by X-ray diffraction (XRD),N2 sorption-desorption,UV-Vis diffuse reflectance spectroscopy (UV-Vis DRS),transmission electron microscopy (TEM),electron spin resonance (ESR),X-ray photoelectron spectra (XPS) and electrochemistry technology.It is found that under ultraviolet light irradiation,ZnGa2O4 sample prepared by microwave solvothermal method exhibits a higher photocatalytic activity (achieving 99.1% in 40 min) than that of the TiO2 sample (achieving 84.5% in 40 min) in the oxidization of arsenate (As2O3)3-.Moreover,the active species (O2-·) and cavity (hvb+) are recognized as the primary active species responsible for As(Ⅲ) oxidation.A possible mechanism for the photo-oxidation of As(Ⅲ) over ZnGa2O4 is also proposed.
关键词
ZnGa2O4
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As(Ⅲ)氧化
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光催化
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微波溶剂热法
Key words
ZnGa2O4
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As(Ⅲ) oxidation
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photocatalysis
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microwave solvothermal method
Author summay
田勤奋(1986-),女,硕士,实验师,研究方向为纳米光催化材料,tianqinfen@163.com
微波溶剂热法制备ZnGa2O4及其在光催化氧化除As(Ⅲ)中的应用[J].
现代化工, 2019, 39(4): 116-120,122 DOI:10.16606/j.cnki.issn0253-4320.2019.04.026